Lyell Collection

Geological Society, London, Special Publications

Lyell Centre  |   Lyell Collection  |   Subscriptions   |   Geological Society  |   Email alerts  |   Online bookshop  |   Help


Keywords:
Author:
Advanced search>>
This Article
Right arrow Full Text (PDF)
Right arrow References
Right arrow Alert me when this article is cited
Right arrow Alert me if a correction is posted
Right arrow Citation Map
Services
Right arrow Email this article to a friend
Right arrow Similar articles in this journal
Right arrow Alert me to new issues of the journal
Right arrow Download to citation manager
Right arrow Request Permissions
Citing Articles
Right arrow Citing Articles via HighWire
Right arrow Citing Articles via Google Scholar
Google Scholar
Right arrow Articles by Pye, K.
Right arrow Search for Related Content
GeoRef
Right arrow GeoRef Citation
Geological Society, London, Special Publications; 2004; v. 232; p. 103-121;
DOI: 10.1144/GSL.SP.2004.232.01.11
© 2004 Geological Society of London

Forensic examination of rocks, sediments, soils and dusts using scanning electron microscopy and X-ray chemical microanalysis

Kenneth Pye1,2

1 Kenneth Pye Associates Ltd, Crowthorne Enterprise Centre, Growthorne Business Estate, Old Wokingham Road, Crowthorne RG45 6AW, UK k.pye{at}kpal.co.uk
2 Department of Geology, Royal Holloway, University of London, Egham Hill, Egham TW20 0EX, UK

Scanning electron microscopy (SEM) and energy-dispersive X-ray (EDX) microanalysis are powerful techniques for forensic and wider environmental analysis of a range of materials, including rocks, sediments, soils and dusts. Methods of analysis have evolved rapidly over the past 40 years and computer-controlled, variable pressure SEMs with integrated EDX now provide the opportunity for rapid, automated analysis of large numbers of samples and particulates within individual samples. However, interpretation of the data requires care and experience on the part of the operator, and samples should always be checked by visual inspection. Early SEM work on rocks and sediments mainly used the secondary electron (SE) mode to produce topographical contrast on rough surfaces, but more recent studies have utilized the capacity of backscattered electron (BSE) imaging to image both topographical and atomic number contrast. BSE microscopy, combined with X-ray mapping, provides a rapid means of locating unusual particles and grain coatings, and of mapping their distribution, which may be of diagnostic or discriminatory importance. In the past, much attention has been given to grain surface textural features (mainly of quartz) but many such studies have suffered from a high degree of subjectivity, poor reproducibility, lack of discriminatory power, and high cost both in terms of time and money. The application of digital imaging and statistical data-processing techniques can to some extent reduce these problems but, in general, chemical characterization of particles offers a more powerful approach. This paper provides an overview of these techniques, discusses their limitations and illustrates some of the forensic and wider environmental applications.





This article has been cited by other articles:


Home page
Geological Society, London, Special PublicationsHome page
K. Pye and D. J. Croft
Forensic geoscience: introduction and overview
Geological Society, London, Special Publications, 2004; 232: 1 - 5.
[Abstract] [PDF]


Home page
Geological Society, London, Special PublicationsHome page
S. E. Saye and K. Pye
Development of a coastal dune sediment database for England and Wales: forensic applications
Geological Society, London, Special Publications, 2004; 232: 75 - 96.
[Abstract] [PDF]


Home page
Geological Society, London, Special PublicationsHome page
D. Pirrie, A. R. Butcher, M. R. Power, P. Gottlieb, and G. L. Miller
Rapid quantitative mineral and phase analysis using automated scanning electron microscopy (QemSCAN); potential applications in forensic geoscience
Geological Society, London, Special Publications, 2004; 232: 123 - 136.
[Abstract] [PDF]